
To work in a challenging environment demanding all my skills and efforts to explore and adapt myself in different fields and realize my potential where I get the opportunity for continuous learning.
Design For Testability
Scan Insertion
DRC Analysis
Scan compression
ATPG Pattern Generation
Coverage Analysis
On-Chip Clock Controller
Scan Pattern Simulation
JTAG
Boundary Scan
MBIST Insertion
Digital Design
Verilog
TCL
GVIM
Linux
Tessent
TestKompress
QuestaSim
DesignCompilers