Dynamic engineering leader with extensive experience at Samsung Semiconductor, excelling in Flash Memory firmware development. Proven track record in enhancing product reliability and performance, scaling infrastructure through innovative strategies. Skilled in embedded C/C++ programming and adept at collaborating with cross-functional teams to drive successful product outcomes.
Firmware development for SATA and NVMe
Product engineering for eMMC and uSD
Flash memory architecture
Flash Interface Layer
NAND Flash Error prevention and recovery algorithms
Functional and reliability testing
Embedded C/C programming
Magnum2 ATE architecture
Logic analyser, Protocol analyser and JTAG T32
1. Holds Professional C++ programming certificate in Samsung Internal competitive coding contest.
2. Technical Paper “Timing Parameter Measurement in Multi DUT Parallel Testing” was presented at International Conference Teradyne Users Group 2013 Fort Worth Texas
3. Abstract “Bench marking Analysis Methods for Secure Digital Cards” is selected for International Conference Teradyne Users Group 2014
4. Key contributor in First Micro-SD and eMMC product development from Samsung India labs which resulted in several awards.