Software Engineer II
KLA
03.2025 - Current
Data Reporting Extension for Semiconductor Overlay Tool
- Built a C++/C# Simulator Data Provider from scratch, enabling dataset generation from customer measurement data to reproduce field issues without hardware.
- Achieved 98% accuracy in simulating real tool behavior, reducing debugging time, cost, and production tool dependency.
- Resolved Autofac DI challenges, heap corruptions, and memory leaks, improving stability.
- Proposed a CNN-based image recognition solution (under evaluation) with potential 75% faster processing.
Autorun Enhancement using 1DCBS + KNN ML-Based Acquisition
- Designed and implemented recipe support for 1D-CBS centering and k-NN focus algorithms, cutting Autorun acquisition time.
- Developed UI components in MFC (C++) and WinForms (C#/.NET) for recipe editing.
- Enabled cross-language communication between C++ and C# layers via serialization adapters.
- Supported XRC script import/export and recipe distribution management for version control and consistency.
Data Reporting Extension for Semiconductor Overlay Tool
- Enhanced reporting by adding Layer Label and Measurement Label metadata, improving wafer traceability and analysis.
- Delivered full-stack updates: backend (C++), configuration layer, UI (C# WinForms), and ARC automation.
- Standardized default assignment and validation across layers for consistency.
- Collaborated with stakeholders to clarify requirements and finalize strategy.
